JPH0281479U - - Google Patents
Info
- Publication number
- JPH0281479U JPH0281479U JP16103888U JP16103888U JPH0281479U JP H0281479 U JPH0281479 U JP H0281479U JP 16103888 U JP16103888 U JP 16103888U JP 16103888 U JP16103888 U JP 16103888U JP H0281479 U JPH0281479 U JP H0281479U
- Authority
- JP
- Japan
- Prior art keywords
- radiator
- radiation intensity
- intensity distribution
- sensor
- display device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000005855 radiation Effects 0.000 claims description 11
- 238000005259 measurement Methods 0.000 claims 3
- 238000010586 diagram Methods 0.000 description 4
- 238000000034 method Methods 0.000 description 2
Landscapes
- Measurement Of Velocity Or Position Using Acoustic Or Ultrasonic Waves (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16103888U JPH0281479U (en]) | 1988-12-12 | 1988-12-12 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16103888U JPH0281479U (en]) | 1988-12-12 | 1988-12-12 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH0281479U true JPH0281479U (en]) | 1990-06-22 |
Family
ID=31443635
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP16103888U Pending JPH0281479U (en]) | 1988-12-12 | 1988-12-12 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0281479U (en]) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0526930A (ja) * | 1991-07-23 | 1993-02-05 | Nec Corp | 電磁界分布測定装置及び電磁波源解析システム及び電磁界解析システム |
-
1988
- 1988-12-12 JP JP16103888U patent/JPH0281479U/ja active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0526930A (ja) * | 1991-07-23 | 1993-02-05 | Nec Corp | 電磁界分布測定装置及び電磁波源解析システム及び電磁界解析システム |
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